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TID and SEU testing of the novel X-CHIP-03 monolithic pixel detector
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SYSNO 0538009 Title TID and SEU testing of the novel X-CHIP-03 monolithic pixel detector Author(s) Marčišovská, M. (CZ)
Dudas, D. (CZ)
Havránek, M. (CZ)
Kabátová, A. (CZ)
Kafka, V. (CZ)
Kostina, A. (CZ)
Macková, A. (CZ)
Marcisovský, M. (CZ)
Mitrofanov, S. V. (RU)
Popule, Jiří (FZU-D) RID, ORCID
Romanenko, Oleksandr V. (UJF-V) [ONF] ORCID, SAI
Tomášek, L. (CZ)
Vrba, V. (CZ)Source Title Journal of Instrumentation. Roč. 15, č. 1 (2020), s. 1-11. - : Institute of Physics Publishing Article number C01043 Document Type Článek v odborném periodiku Grant EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support FZU-D - RVO:68378271 ; UJF-V - RVO:61389005 Language eng Country GB Keywords radiation damage to detector materials (solid state) * radiation damage to electronic components * radiation-hard detectors * radiation-hard electronics URL https://doi.org/10.1088/1748-0221/15/01/C01043 Permanent Link http://hdl.handle.net/11104/0315849
Number of the records: 1