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Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer

  1. 1.
    SYSNO0525529
    TitleLow-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer
    Author(s) Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAI
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Paták, Aleš (UPT-D) RID, ORCID, SAI
    Polčák, J. (CZ)
    Sluyterman, S. (NL)
    Lejeune, M. (FR)
    Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Corespondence/seniorMaterna Mikmeková, Eliška - Korespondující autor
    Source Title Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020). - : Elsevier
    Article number146873
    Document TypeČlánek v odborném periodiku
    Grant 606988, XE - EU countries
    TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
    LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportUPT-D - RVO:68081731
    Languageeng
    CountryNL
    Keywords graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy
    URLhttps://www.sciencedirect.com/science/article/pii/S0368204818302068
    Permanent Linkhttp://hdl.handle.net/11104/0309642
     
Number of the records: 1  

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