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Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer
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SYSNO 0525529 Title Low-energy electron microscopy of graphene outside UHV: electron-induced removal of PMMA residues used for graphene transfer Author(s) Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAI
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Frank, Luděk (UPT-D) RID, SAI, ORCID
Paták, Aleš (UPT-D) RID, ORCID, SAI
Polčák, J. (CZ)
Sluyterman, S. (NL)
Lejeune, M. (FR)
Konvalina, Ivo (UPT-D) RID, ORCID, SAICorespondence/senior Materna Mikmeková, Eliška - Korespondující autor Source Title Journal of Electron Spectroscopy and Related Phenomena. Roč. 241, MAY (2020). - : Elsevier Article number 146873 Document Type Článek v odborném periodiku Grant 606988, XE - EU countries TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UPT-D - RVO:68081731 Language eng Country NL Keywords graphene * PMMA * slow electron treatment * XPS * Raman spectroscopy URL https://www.sciencedirect.com/science/article/pii/S0368204818302068 Permanent Link http://hdl.handle.net/11104/0309642
Number of the records: 1