Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration

Number of the records: 1

1.

SYSNO	0525112
Title	Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration
Author(s)	Skoupý, Radim (UPT-D)_{RID, ORCID, SAI} Fořt, Tomáš (UPT-D)_{RID, ORCID, SAI} Krzyžánek, Vladislav (UPT-D)_{RID, ORCID, SAI}
Source Title	Nanomaterials. Roč. 10, č. 2 (2020). - : MDPI
Article number	332
Document Type	Článek v odborném periodiku
Grant	GA17-15451S GA ČR - Czech Science Foundation (CSF)
	FV30271 GA MPO - Ministry of Industry and Trade (MPO), CZ - Czech Republic
Institutional support	UPT-D - RVO:68081731
Language	eng
Country	CH
Keywords	SEM * quantitative imaging * back-scattered electrons * standardless calibration * electron mirror * sample bias * Monte Carlo simulation * thin coating layers
URL	https://www.mdpi.com/2079-4991/10/2/332
Permanent Link	http://hdl.handle.net/11104/0309322

Number of the records: 1