Number of the records: 1

Determination of thickness refinement using STEM detector segments

SYSNO	0524885
Title	Determination of thickness refinement using STEM detector segments
Author(s)	Skoupý, Radim (UPT-D)_{RID, ORCID, SAI} Krzyžánek, Vladislav (UPT-D)_{RID, ORCID, SAI}
Source Title	10th Anniversary International Conference on Nanomaterials - Research and Application (NANOCON 2018). S. 677-681. - Ostrava : Tanger, 2019
Conference	Anniversary International Conference on Nanomaterials - Research and Application (NANOCON) /10./, 17.10.2018 - 19.10.2018, Brno
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	GA17-15451S GA ČR - Czech Science Foundation (CSF)
	LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	UPT-D - RVO:68081731
Language	eng
Country	CZ
Keywords	electron-microscopy * Quantitative STEM * thickness determination * detector segments * Monte Carlo simulation
Permanent Link	http://hdl.handle.net/11104/0309122

Number of the records: 1