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Surface imaging with UHV SLEEM and SEM LEEM
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SYSNO 0522221 Title Surface imaging with UHV SLEEM and SEM LEEM Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Jánský, P. (CZ)
Kolařík, V. (CZ)
Müllerová, Ilona (UPT-D) RID, SAI, ORCIDSource Title Microscopy and Microanalysis. Roč. 25, S2 (2019), s. 444-445. - : Cambridge University Press Conference Microscopy & Microanalysis 2019 Meeting, 04.08.2019 - 08.08.2019, Portland Document Type Abstrakt Grant TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic Institutional support UPT-D - RVO:68081731 Language eng Country US Keywords surface imaging * UHV SLEEM * SEM LEEM Permanent Link http://hdl.handle.net/11104/0306716
Number of the records: 1