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Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons
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SYSNO 0510307 Title Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons Author(s) Konvalina, Ivo (UPT-D) RID, ORCID, SAI
Daniel, Benjamin (UPT-D) RID
Zouhar, Martin (UPT-D) ORCID, RID, SAI
Piňos, Jakub (UPT-D) RID, ORCID, SAI
Radlička, Tomáš (UPT-D) RID, ORCID, SAI
Frank, Luděk (UPT-D) RID, SAI, ORCID
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAISource Title Microscopy and Microanalysis. Roč. 25, S2 (2019), s. 482-483. - : Cambridge University Press Conference Microscopy & Microanalysis 2019 Meeting, 04.08.2019 - 08.08.2019, Portland Document Type Abstrakt Grant TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic Institutional support UPT-D - RVO:68081731 Language eng Country US Keywords two-dimensional (2D) materials * microscopy and spectroscopy * low energy electrons Permanent Link http://hdl.handle.net/11104/0300816
Number of the records: 1