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Studying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons

  1. 1.
    SYSNO0510307
    TitleStudying 2D Materials by Means of Microscopy and Spectroscopy with Low Energy Electrons
    Author(s) Konvalina, Ivo (UPT-D) RID, ORCID, SAI
    Daniel, Benjamin (UPT-D) RID
    Zouhar, Martin (UPT-D) ORCID, RID, SAI
    Piňos, Jakub (UPT-D) RID, ORCID, SAI
    Radlička, Tomáš (UPT-D) RID, ORCID, SAI
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Materna Mikmeková, Eliška (UPT-D) ORCID, RID, SAI
    Source Title Microscopy and Microanalysis. Roč. 25, S2 (2019), s. 482-483. - : Cambridge University Press
    Conference Microscopy & Microanalysis 2019 Meeting, 04.08.2019 - 08.08.2019, Portland
    Document TypeAbstrakt
    Grant TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
    Institutional supportUPT-D - RVO:68081731
    Languageeng
    CountryUS
    Keywords two-dimensional (2D) materials * microscopy and spectroscopy * low energy electrons
    Permanent Linkhttp://hdl.handle.net/11104/0300816
     
Number of the records: 1  

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