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Quantitative STEM imaging of electron beam induced mass loss of epoxy resin sections

  1. 1.
    SYSNO0508172
    TitleQuantitative STEM imaging of electron beam induced mass loss of epoxy resin sections
    Author(s) Skoupý, Radim (UPT-D) RID, ORCID, SAI
    Nebesářová, Jana (BC-A) RID, ORCID
    Šlouf, Miroslav (UMCH-V) [MATER] RID, ORCID
    Krzyžánek, Vladislav (UPT-D) RID, ORCID, SAI
    Corespondence/seniorKrzyžánek, Vladislav - Korespondující senior autor
    Source Title Ultramicroscopy. Roč. 202, JUL (2019), s. 44-50. - : Elsevier
    Document TypeČlánek v odborném periodiku
    Grant GA17-15451S GA ČR - Czech Science Foundation (CSF)
    LM2015062 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    TN01000008 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
    Institutional supportUPT-D - RVO:68081731 ; BC-A - RVO:60077344 ; UMCH-V - RVO:61389013
    Languageeng
    CountryNL
    Keywords scanning electron microscopy * scanning transmission electron microscopy * mass loss * epoxy resin * EMbed 812 resin * epon resin
    Cooperating institutions Biologické centrum AV ČR (Czech Republic)
    Ústav makromolekulární chemie AV ČR (Czech Republic)
    URLhttps://www.sciencedirect.com/science/article/pii/S0304399118304315?via%3Dihub
    Permanent Linkhttp://hdl.handle.net/11104/0299148
     
Number of the records: 1  

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