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Damage accumulation and structural modification in c-plane and a-plane GaN implanted with 400 keV Kr and Gd ions

  1. 1.
    SYSNO0497102
    TitleDamage accumulation and structural modification in c-plane and a-plane GaN implanted with 400 keV Kr and Gd ions
    Author(s) Macková, Anna (UJF-V) [ONF] RID, ORCID, SAI
    Malinský, Petr (UJF-V) [ONF] RID, ORCID, SAI
    Jagerová, Adéla (UJF-V) [ONF] ORCID, SAI
    Sofer, Z. (CZ)
    Klímová, K. (CZ)
    Sedmidubský, D. (CZ)
    Mikulics, M. (DE)
    Bottger, R. (DE)
    Akhmadaliev, S. (DE)
    Corespondence/seniorMacková, Anna - Korespondující autor
    Source Title Surface and Coatings Technology. Roč. 355, SI (2018), s. 22-28. - : Elsevier
    Conference International Conference on Surface Modification of Materials by Ion Beams (SMMIB), 09.07.2017 - 14.07.2017, Lisbon
    Document TypeČlánek v odborném periodiku
    Grant EF16_013/0001812 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2015056 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    GA15-01602S GA ČR - Czech Science Foundation (CSF)
    Institutional supportUJF-V - RVO:61389005
    Languageeng
    CountryCH
    Keywords GaN damage accumulation * structure modification in c-plane and a-plane * GaN * RBS channeling studies of implanted GaN
    Cooperating institutions Univerzita Jana Evangelisty Purkyně v Ústí nad Labem (Czech Republic)
    Vysoká škola chemicko-technologická v Praze (Czech Republic)
    Permanent Linkhttp://hdl.handle.net/11104/0289694
     
Number of the records: 1  

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