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In-situ diffraction measurements using the ISX-stage.
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SYSNO 0487074 Title In-situ diffraction measurements using the ISX-stage. Author(s) Pavlíček, Jiří (BTO-N) RID
Vellieux, Frédéric (BTO-N)Type of action Workshop Place, date 20170330, Vestec Document Type Uspořádání konference, workshopu, výstavy Grant LM2015043 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic ED1.1.00/02.0109 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic Institutional support BTO-N - RVO:86652036 Language eng Keywords diffraction properties * crystals * crystallisation plates Permanent Link http://hdl.handle.net/11104/0281850
Number of the records: 1