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X-ray analysis of fully depleted CCDs with small pixel size
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SYSNO 0485070 Title X-ray analysis of fully depleted CCDs with small pixel size Author(s) Kotov, I.V. (US)
Haupt, J. (US)
Kubánek, Petr (FZU-D) RID
O'Connor, P. (US)
Takacs, P. (US)Source Title Nuclear Instruments & Methods in Physics Research Section A. Roč. 787, Jul (2015), s. 12-19. - : Elsevier Document Type Článek v odborném periodiku Institutional support FZU-D - RVO:68378271 Language eng Country NL Keywords charge diffusion * Charge transfer efficiency * CTE * CCD Permanent Link http://hdl.handle.net/11104/0280173
Number of the records: 1