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Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl

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    SYSNO0481772
    TitleXenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl
    Author(s) Kopeček, Jaromír (FZU-D) RID, ORCID
    Jurek, Karel (FZU-D) RID
    Kopecký, Vít (FZU-D)
    Klimša, Ladislav (FZU-D)
    Seiner, Hanuš (UT-L) RID
    Sedlák, Petr (UT-L) RID
    Landa, Michal (UT-L) RID
    Dluhoš, J. (CZ)
    Petrenec, M. (CZ)
    Hladík, L. (CZ)
    Doupal, A. (CZ)
    Heczko, Oleg (FZU-D) RID
    Source Title Microscopy and Microanalysis. Roč. 20, Aug (2014), s. 335-336
    Document TypeČlánek v odborném periodiku
    Grant GA14-03044S GA ČR - Czech Science Foundation (CSF), CZ - Česká republika
    Institutional supportFZU-D - RVO:68378271 ; UT-L - RVO:61388998
    Languageeng
    CountryUS
    Keywords scanning electron microscope * SEM * focused ion beam * FIB * xenon plasma focused ion beam * dual beam * shape memory alloy * SMA
    Permanent Linkhttp://hdl.handle.net/11104/0277259
     
Number of the records: 1