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Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl
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SYSNO 0481772 Title Xenon focused ion beam in the shape memory alloys investigation – the case of NiTi and CoNiAl Author(s) Kopeček, Jaromír (FZU-D) RID, ORCID
Jurek, Karel (FZU-D) RID, ORCID, SAI
Kopecký, Vít (FZU-D) ORCID
Klimša, Ladislav (FZU-D) ORCID
Seiner, Hanuš (UT-L) RID, ORCID
Sedlák, Petr (UT-L) RID, ORCID
Landa, Michal (UT-L) RID
Dluhoš, J. (CZ)
Petrenec, M. (CZ)
Hladík, L. (CZ)
Doupal, A. (CZ)
Heczko, Oleg (FZU-D) RID, ORCIDSource Title Microscopy and Microanalysis. Roč. 20, Aug (2014), s. 335-336. - : Cambridge University Press Document Type Článek v odborném periodiku Grant GA14-03044S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic Institutional support FZU-D - RVO:68378271 ; UT-L - RVO:61388998 Language eng Country US Keywords scanning electron microscope * SEM * focused ion beam * FIB * xenon plasma focused ion beam * dual beam * shape memory alloy * SMA Permanent Link http://hdl.handle.net/11104/0277259
Number of the records: 1