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Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode

  1. 1.
    SYSNO0480451
    TitleLaser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode
    Author(s) Řeřucha, Šimon (UPT-D) RID, ORCID, SAI
    Yacoot, A. (GB)
    Pham, Minh Tuan (UPT-D) RID, ORCID, SAI
    Čížek, Martin (UPT-D) RID, ORCID, SAI
    Hucl, Václav (UPT-D) RID, ORCID, SAI
    Lazar, Josef (UPT-D) RID, ORCID, SAI
    Číp, Ondřej (UPT-D) RID, SAI, ORCID
    Source Title Measurement Science and Technology. Roč. 28, č. 4 (2017), s. 1-11. - : Institute of Physics Publishing
    Article number045204
    Document TypeČlánek v odborném periodiku
    Grant GB14-36681G GA ČR - Czech Science Foundation (CSF)
    LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    TE01020233 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    Institutional supportUPT-D - RVO:68081731
    Languageeng
    CountryGB
    Keywords optical metrology * DBR laser diode * frequency stabilization * laser interferometry * dimensional metrology * iodine stabilization * displacement measurement
    Permanent Linkhttp://hdl.handle.net/11104/0276231
     
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