Comparison of LVEM5, LVEM25 and standard TEM

Number of the records: 1

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SYSNO	0477368
Title	Comparison of LVEM5, LVEM25 and standard TEM
Author(s)	Coufalová, E. (CZ) Pavlova, Ewa (UMCH-V) [MATER]_RID Šlouf, Miroslav (UMCH-V) [MATER]_{RID, ORCID} Štěpán, P. (CZ) Drštička, M. (CZ) Kolařík, V. (CZ) Hozák, Pavel (UMG-J) [25]_{RID, ORCID}
Source Title	Proceedings. S. 507-508. - Lausanne : Swiss Society for Optics and Microscopy, 2017
Conference	Microscopy Conference, 21.08.2017 - 25.08.2017, Lausanne
Document Type	Abstrakt
Grant	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR), CZ - Czech Republic
Institutional support	UMCH-V - RVO:61389013 ; UMG-J - RVO:68378050
Language	eng
Country	CH
Keywords	electron microscopy * nanostructure of materials
Permanent Link	http://hdl.handle.net/11104/0274188

Number of the records: 1