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Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.
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SYSNO 0469204 Title Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens. Author(s) Germer, S. (DE)
Pietag, F. (DE)
Polák, Jaroslav (UFP-V) [TOPTEC] RID
Arnold, T. (DE)Corespondence/senior Germer, S. - Korespondující autor Source Title Review of Scientific Instruments. Roč. 87, č. 11 (2016). - : AIP Publishing Conference Topical Conference on High-Temperature Plasma Diagnostics/21./, 05.06.2016 - 09.06.2016, Madison Article number 113301 Document Type Článek v odborném periodiku Institutional support UFP-V - RVO:61389021 Language eng Country US Keywords Current density * Etching * Faraday cups * Ion beam sources * Cameras Cooperating institutions Leibniz-Institut für Oberflächenmodifizierung E.V., Permoserstr. 15, Leipzig (Germany) URL http://aip.scitation.org/doi/full/10.1063/1.4964701 Permanent Link http://hdl.handle.net/11104/0267029 File Download Size Commentary Version Access Quantitative low-energy ion beam characterization by beam profiling and imaging via scintillation screens.pdf 2 3.5 MB Publisher’s postprint require
Number of the records: 1