Profilometry of thin films on rough substrates by Raman spectroscopy

Number of the records: 1

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SYSNO	0469174
Title	Profilometry of thin films on rough substrates by Raman spectroscopy
Author(s)	Ledinský, Martin (FZU-D)_{RID, ORCID, SAI} Paviet-Salomon, B. (CH) Vetushka, Aliaksi (FZU-D)_{RID, ORCID} Geissbühler, J. (CH) Tomasi, A. (CH) Despeisse, M. (CH) De Wolf, S. (SA) Ballif, C. (CH) Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI}
Source Title	Scientific Reports. Roč. 6, Dec (2016), s. 1-7. - : Nature Publishing Group
Article number	37859
Document Type	Článek v odborném periodiku
Grant	LM2015087 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	GA14-15357S GA ČR - Czech Science Foundation (CSF)
	727523 NextBase, XE - EU countries
Institutional support	FZU-D - RVO:68378271
Language	eng
Country	GB
Keywords	solar cells * surfaces * interfaces and thin films * two-dimensional materials
Permanent Link	http://hdl.handle.net/11104/0267018

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Number of the records: 1