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Characterization of thin MnSi and MnGe Layers Prepared by Reactive UV Pulsed Laser Deposition.
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SYSNO 0465309 Title Characterization of thin MnSi and MnGe Layers Prepared by Reactive UV Pulsed Laser Deposition. Author(s) Koštejn, Martin (UCHP-M) RID, SAI, ORCID
Fajgar, Radek (UCHP-M) RID, ORCID, SAI
Dytrych, Pavel (UCHP-M) RID, ORCID, SAI
Kupčík, Jaroslav (UCHP-M) RID, ORCID, SAI
Dřínek, Vladislav (UCHP-M) RID, ORCID, SAI
Jandová, Věra (UCHP-M) RID, ORCID, SAI
Huber, Š. (CZ)
Novotný, F. (CZ)Source Title Thin Solid Films. Roč. 619, NOV 30 (2016), s. 73-80. - : Elsevier Document Type Článek v odborném periodiku Grant GC15-08842J GA ČR - Czech Science Foundation (CSF) Institutional support UCHP-M - RVO:67985858 Language eng Country CH Keywords diluted ferromagnetic semiconductor * reactive pulsed laser deposition * silicide Cooperating institutions Vysoká škola chemicko-technologická (Czech Republic)
České vysoké učení technické (Czech Republic)Permanent Link http://hdl.handle.net/11104/0266707 File Download Size Commentary Version Access 0465309.pdf 2 2 MB Publisher’s postprint open-access
Number of the records: 1