Number of the records: 1  

Characterization of amorphous and microcrystalline Si layers and ZnO layers on glass

    1.
    SYSNO0458106
    TitleCharacterization of amorphous and microcrystalline Si layers and ZnO layers on glass
    Author(s) Vaněček, Milan (FZU-D) RID
    Holovský, Jakub (FZU-D) RID, ORCID
    Poruba, Aleš (FZU-D) RID
    Remeš, Zdeněk (FZU-D) RID, ORCID
    Purkrt, Adam (FZU-D) RID
    Issue dataPraha: Tel Solar AG, Trübbach, Switzerland, 2015
    Document TypeVýzkumná zpráva
    GrantNon-public resources
    Languageeng
    CountryCZ
    Keywords optical properties * amorphous silicon * microcrystalline silicon * ZnO
    Permanent Linkhttp://hdl.handle.net/11104/0258426
     
Number of the records: 1  

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