Number of the records: 1  

Characterisation of silicon carbide layers formed during BNCD deposition

  1. 1.
    SYSNO0456477
    TitleCharacterisation of silicon carbide layers formed during BNCD deposition
    Author(s) Taylor, Andrew (FZU-D) RID, ORCID
    Ashcheulov, Petr (FZU-D) ORCID, RID
    Čada, Martin (FZU-D) RID, ORCID, SAI
    Drahokoupil, Jan (FZU-D) RID, ORCID
    Fekete, Ladislav (FZU-D) RID, ORCID
    Klimša, Ladislav (FZU-D) ORCID
    Olejníček, Jiří (FZU-D) RID, ORCID
    Remeš, Zdeněk (FZU-D) RID, ORCID
    Čtvrtlík, R. (CZ)
    Tomáštík, J. (CZ)
    Janíček, P. (CZ)
    Mistrík, J. (CZ)
    Kopeček, Jaromír (FZU-D) RID, ORCID
    Mortet, Vincent (FZU-D) RID, ORCID
    Source TitleDiamond Conference. P6.1-P6.3. - Coventry : University of Warwick, 2015 / Newton M.
    Conference De Beers Diamond Conference 2015, 06.07.2015 - 09.07.2015, Warwick
    Document TypeAbstrakt
    Grant GA13-31783S GA ČR - Czech Science Foundation (CSF)
    CZ.1.07/2.3.00/20.0306, XE - EU countries
    LO1409 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LM2011029 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    Institutional supportFZU-D - RVO:68378271
    Languageeng
    CountryGB
    Keywords silicon carbide * nano-crystalline diamond
    Permanent Linkhttp://hdl.handle.net/11104/0256994
     
Number of the records: 1  

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