Number of the records: 1
Electron beam induced mass loss dependence on aging of Epon resin sections
- 1.
SYSNO 0452276 Title Electron beam induced mass loss dependence on aging of Epon resin sections Author(s) Skoupý, Radim (UPT-D) RID, ORCID, SAI
Krzyžánek, Vladislav (UPT-D) RID, ORCID, SAI
Kočová, L. (CZ)
Nebesářová, Jana (BC-A) RID, ORCIDSource Title 12th Multinational Congress on Microscopy. S. 112-113. - Budapest : Akadémiai Kiadó, 2015 Conference MCM 2015. Multinational Congress on Microscopy /12./, Eger, 23.08.2015-28.08.2015 Document Type Konferenční příspěvek (zahraniční konf.) Grant GA14-20012S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) Institutional support UPT-D - RVO:68081731 ; BC-A - RVO:60077344 Language eng Country HU Keywords STEM * mass loss * resin * Epon Cooperating institutions Biologické centrum AV ČR (Czech Republic) Permanent Link http://hdl.handle.net/11104/0253305
Number of the records: 1