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Electron beam induced mass loss dependence on aging of Epon resin sections

  1. 1.
    SYSNO0452276
    TitleElectron beam induced mass loss dependence on aging of Epon resin sections
    Author(s) Skoupý, Radim (UPT-D) RID, ORCID, SAI
    Krzyžánek, Vladislav (UPT-D) RID, ORCID, SAI
    Kočová, L. (CZ)
    Nebesářová, Jana (BC-A) RID, ORCID
    Source Title 12th Multinational Congress on Microscopy. S. 112-113. - Budapest : Akadémiai Kiadó, 2015
    Conference MCM 2015. Multinational Congress on Microscopy /12./, Eger, 23.08.2015-28.08.2015
    Document TypeKonferenční příspěvek (zahraniční konf.)
    Grant GA14-20012S GA ČR - Czech Science Foundation (CSF), CZ - Czech Republic
    LO1212 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    Institutional supportUPT-D - RVO:68081731 ; BC-A - RVO:60077344
    Languageeng
    CountryHU
    Keywords STEM * mass loss * resin * Epon
    Cooperating institutions Biologické centrum AV ČR (Czech Republic)
    Permanent Linkhttp://hdl.handle.net/11104/0253305
     
Number of the records: 1  

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