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Low-frequency noise measurements used for quality assessment of GaSb based laser diodes prepared by molecular beam epitaxy
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SYSNO 0450842 Title Low-frequency noise measurements used for quality assessment of GaSb based laser diodes prepared by molecular beam epitaxy Author(s) Chobola, Z. (CZ)
Luňák, M. (CZ)
Vaněk, J. (CZ)
Hulicius, Eduard (FZU-D) RID, ORCID, SAI
Kusák, I. (CZ)Source Title Journal of Electrical Engineering. Roč. 66, č. 4 (2015), s. 226-230 Document Type Článek v odborném periodiku Institutional support FZU-D - RVO:68378271 Language eng Country CZ Keywords silicon solar-cells * electrical noise * tool Permanent Link http://hdl.handle.net/11104/0252049
Number of the records: 1