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Ultra-fast three dimensional microanalysis using the scanning electron microscope equipped with xenon plasma focused ion beam
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SYSNO 0432741 Title Ultra-fast three dimensional microanalysis using the scanning electron microscope equipped with xenon plasma focused ion beam Author(s) Dluhoš, J. (CZ)
Petrenec, M. (CZ)
Peřina, P. (CZ)
Reinauer, F. (DE)
Kopeček, Jaromír (FZU-D) RID, ORCID
Hrnčíř, T. (CZ)
Jiruše, J. (CZ)Source Title Proceedings of 18th International Microscopy Congress. - Prague : Czechoslovak Microscopy Society, 2014 / Hozák P. Conference International Microscopy Congress /18./, Prague, 07.09.2014-12.09.2014 Document Type Abstrakt Institutional support FZU-D - RVO:68378271 Language eng Keywords SEM * FIB * xenon Permanent Link http://hdl.handle.net/11104/0237116
Number of the records: 1