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Impact of crystallisation processes on depth profile formation in sol-gel PbZr.sub.0·52./sub.Ti.sub.0·48./sub.O.sub.3./sub. thin films

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    SYSNO0392014
    TitleImpact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films
    Author(s) Aulika, I. (IT)
    Mergen, S. (AU)
    Bencan, A. (SI)
    Zhang, Q. (GB)
    Dejneka, Alexandr (FZU-D) RID, ORCID
    Kosec, M. (SI)
    Kundzins, K. (LT)
    Demarchi, D. (IL)
    Civera, P. (IT)
    Source Title Advances in Applied Ceramics . Roč. 112, č. 1 (2013), s. 53-58. - : Taylor & Francis
    Document TypeČlánek v odborném periodiku
    Grant TA01010517 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
    GAP108/12/1941 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z10100522 - FZU-D (2005-2011)
    Languageeng
    CountryGB
    Keywords compositional and optical gradien * PZT * spectroscopic ellipsometry * crystallisation proces * sol-gel * XRD * thin films * depth profile * spectroscopic elipsometry
    Permanent Linkhttp://hdl.handle.net/11104/0220997
     
Number of the records: 1  

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