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Impact of crystallisation processes on depth profile formation in sol-gel PbZr.sub.0·52./sub.Ti.sub.0·48./sub.O.sub.3./sub. thin films
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SYSNO 0392014 Title Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films Author(s) Aulika, I. (IT)
Mergen, S. (AU)
Bencan, A. (SI)
Zhang, Q. (GB)
Dejneka, Alexandr (FZU-D) RID, ORCID
Kosec, M. (SI)
Kundzins, K. (LT)
Demarchi, D. (IL)
Civera, P. (IT)Source Title Advances in Applied Ceramics . Roč. 112, č. 1 (2013), s. 53-58. - : Taylor & Francis Document Type Článek v odborném periodiku Grant TA01010517 GA TA ČR - Technology Agency of the Czech Republic (TA ČR) GAP108/12/1941 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z10100522 - FZU-D (2005-2011) Language eng Country GB Keywords compositional and optical gradien * PZT * spectroscopic ellipsometry * crystallisation proces * sol-gel * XRD * thin films * depth profile * spectroscopic elipsometry Permanent Link http://hdl.handle.net/11104/0220997
Number of the records: 1