Scanning Electron Microscopy with Samples in an Electric Field

Number of the records: 1

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SYSNO	0385193
Title	Scanning Electron Microscopy with Samples in an Electric Field
Author(s)	Frank, Luděk (UPT-D)_{RID, SAI, ORCID} Hovorka, Miloš (UPT-D) Mikmeková, Šárka (UPT-D)_{RID, SAI, ORCID} Mikmeková, Eliška (UPT-D)_RID Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Pokorná, Zuzana (UPT-D)_{RID, ORCID, SAI}
Source Title	Materials. Roč. 5, č. 12 (2012), s. 2731-2756. - : MDPI
Document Type	Článek v odborném periodiku
Grant	GAP108/11/2270 GA ČR - Czech Science Foundation (CSF)
	TE01020118 GA TA ČR - Technology Agency of the Czech Republic (TA ČR)
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
Institutional support	UPT-D - RVO:68081731
Language	eng
Country	CH
Keywords	scanning electron microscopy * slow electrons * low energy SEM * low energy STEM * cathode lens
Permanent Link	http://hdl.handle.net/11104/0214527

Number of the records: 1