Number of the records: 1

Very low energy scanning electron microscopy in nanotechnology

SYSNO	0375383
Title	Very low energy scanning electron microscopy in nanotechnology
Author(s)	Müllerová, Ilona (UPT-D)_{RID, SAI, ORCID} Hovorka, Miloš (UPT-D) Mika, Filip (UPT-D)_{RID, SAI, ORCID} Mikmeková, Eliška (UPT-D)_RID Mikmeková, Šárka (UPT-D)_{RID, SAI, ORCID} Pokorná, Zuzana (UPT-D)_{RID, ORCID, SAI} Frank, Luděk (UPT-D)_{RID, SAI, ORCID}
Source Title	International Journal of Nanotechnology. Roč. 9, 8/9 (2012), s. 695-716
Document Type	Článek v odborném periodiku
Grant	OE08012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	IAA100650902 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
Language	eng
Country	GB
Keywords	scanning electron microscopy * very low energy electrons * cathode lens * grain contrast * strain contrast * imaging of participates * dopant contrast * very low energy STEM * graphene
Permanent Link	http://hdl.handle.net/11104/0208054

Number of the records: 1