Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy

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SYSNO	0373735
Title	Determination of single microcrystalline silicon grains preferential crystallographic orientation by polarized Raman spectroscopy
Author(s)	Ledinský, Martin (FZU-D)_{RID, ORCID, SAI} Vetushka, Aliaksi (FZU-D)_{RID, ORCID} Stuchlík, Jiří (FZU-D)_{RID, ORCID} Fejfar, Antonín (FZU-D)_{RID, ORCID, SAI} Kočka, Jan (FZU-D)_{RID, ORCID, SAI}
Source Title	XXII International Conference on Raman Spectroscopy. S. 1109-1110. - Melville : AIP, 2010 / Champion P.M. ; Ziegler L.D.
Conference	International Conference on Raman Spectroscopy /22./, 08.08.2010-13.08.2010, Boston
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	LC06040 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
	KAN400100701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
	LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	240826, XE - EU countries
CEZ	AV0Z10100521 - FZU-D (2005-2011)
Language	eng
Country	US
Keywords	Raman * microcrystalline silicon * atomic force microscopy
Permanent Link	http://hdl.handle.net/11104/0206807

Number of the records: 1