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Detection of Secondary Electrons by Scintillation Detector at VP SEM
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SYSNO 0368932 Title Detection of Secondary Electrons by Scintillation Detector at VP SEM Author(s) Jirák, J. (CZ)
Čudek, P. (CZ)
Neděla, Vilém (UPT-D) RID, ORCID, SAISource Title Microscopy and Microanalysis. Roč. 17, Suppl. 2 (2011), s. 922-923. - : Cambridge University Press Document Type Článek v odborném periodiku Grant GAP102/10/1410 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z20650511 - UPT-D (2005-2011) Language eng Country US Keywords variable pressure scanning electron microscopes (VP-SEM) * scintillation detector * secondary electrons Permanent Link http://hdl.handle.net/11104/0203133
Number of the records: 1