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Detection of Secondary Electrons by Scintillation Detector at VP SEM

  1. 1.
    SYSNO0368932
    TitleDetection of Secondary Electrons by Scintillation Detector at VP SEM
    Author(s) Jirák, J. (CZ)
    Čudek, P. (CZ)
    Neděla, Vilém (UPT-D) RID, ORCID, SAI
    Source Title Microscopy and Microanalysis. Roč. 17, Suppl. 2 (2011), s. 922-923. - : Cambridge University Press
    Document TypeČlánek v odborném periodiku
    Grant GAP102/10/1410 GA ČR - Czech Science Foundation (CSF)
    CEZAV0Z20650511 - UPT-D (2005-2011)
    Languageeng
    CountryUS
    Keywords variable pressure scanning electron microscopes (VP-SEM) * scintillation detector * secondary electrons
    Permanent Linkhttp://hdl.handle.net/11104/0203133
     
Number of the records: 1  

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