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Strain Mapping by Scanning Low Energy Electron Microscopy
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SYSNO 0367893 Title Strain Mapping by Scanning Low Energy Electron Microscopy Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
Man, O. (CZ)
Pantělejev, L. (CZ)
Hovorka, Miloš (UPT-D)
Müllerová, Ilona (UPT-D) RID, SAI, ORCID
Frank, Luděk (UPT-D) RID, SAI, ORCID
Kouřil, M. (CZ)Source Title Materials Structure and Micromechanics of Fracture VI (Key Engineering Materials Vol. 465). S. 338-341. - Zurich : Trans Tech Publications, 2011 / Šandera P. Conference MSMF-6: Materials Structure and Micromechanics of Fracture VI, Brno, 28.06.2010-30.06.2010 Document Type Konferenční příspěvek (zahraniční konf.) Grant IAA100650902 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) OE08012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z20650511 - UPT-D (2005-2011) Language eng Country CH Keywords scanning low energy electron microscopy (SLEEM) * contrast of crystal orientation * microscopic strain Permanent Link http://hdl.handle.net/11104/0202409
Number of the records: 1