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Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates
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SYSNO 0366182 Title Fourier transform photocurrent measurement of thin silicon films on rough, conductive and opaque substrates Author(s) Holovský, Jakub (FZU-D) RID, ORCID
Dagkaldiran, U. (DE)
Remeš, Zdeněk (FZU-D) RID, ORCID
Purkrt, Adam (FZU-D) RID
Ižák, Tibor (FZU-D) RID
Poruba, Aleš (FZU-D) RID
Vaněček, Milan (FZU-D) RIDSource Title Physica Status Solidi A : Applications and Materials Science. Roč. 207, č. 9 (2010), s. 578-581. - : Wiley Document Type Článek v odborném periodiku Grant GD202/09/H041 GA ČR - Czech Science Foundation (CSF) GA202/09/0417 GA ČR - Czech Science Foundation (CSF) 38885, XE - EU countries CEZ AV0Z10100521 - FZU-D (2005-2011) Language eng Country DE Keywords solar cell * silicon * spectroscopy Permanent Link http://hdl.handle.net/11104/0201253
Number of the records: 1