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In-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires

  1. 1.
    SYSNO0365167
    TitleIn-situ synchrotron X-Ray diffraction investigation of the fast recovery of microstructure during electropulse treatment of heavily cold drawn nanocrystalline Ni-Ti wires
    Author(s) Malard, B. (FR)
    Pilch, Jan (FZU-D) RID
    Šittner, Petr (FZU-D) RID, ORCID
    Delville, R. (BE)
    Curfs, C. (FR)
    Source Title Solid State Phenomena. 172-174, č. 6 (2011), s. 1243-1248
    Document TypeČlánek v odborném periodiku
    Grant IAA200100627 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR), CZ - Czech Republic
    LA10010 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    CEZAV0Z10100520 - FZU-D (2005-2011)
    Languageeng
    CountryCH
    Keywords recovery process * electropulse treatment * in-situ analysis * superelasticity
    Permanent Linkhttp://hdl.handle.net/11104/0200473
     
Number of the records: 1  

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