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Comparing different approaches to characterization of focused X-ray laser beams

  1. 1.
    SYSNO0361433
    TitleComparing different approaches to characterization of focused X-ray laser beams
    Author(s) Chalupský, Jaromír (FZU-D) RID, ORCID
    Boháček, Pavel (FZU-D) RID, ORCID, SAI
    Hájková, Věra (FZU-D) RID, ORCID
    Hau-Riege, S.P. (US)
    Heimann, P.A. (US)
    Juha, Libor (FZU-D) RID, ORCID, SAI
    Krzywinski, J. (US)
    Messerschmidt, M. (US)
    Moeller, S.P. (US)
    Nagler, B. (US)
    Rowen, M. (US)
    Schlotter, W.F. (US)
    Swiggers, M.L. (US)
    Turner, J.J. (US)
    Source Title Nuclear Instruments & Methods in Physics Research Section A. Roč. 631, č. 1 (2011), s. 130-133. - : Elsevier
    Document TypeČlánek v odborném periodiku
    Grant KAN300100702 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    LC528 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    GAP208/10/2302 GA ČR - Czech Science Foundation (CSF)
    LA08024 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    IAAX00100903 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
    ME10046 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic
    CEZAV0Z10100523 - FZU-D (2005-2011)
    Languageeng
    CountryNL
    Keywords X-ray laser * X-ray ablation * beam focusing * beam characterization * beam profile measurement
    Permanent Linkhttp://hdl.handle.net/11104/0198745
     
Number of the records: 1  

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