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Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
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SYSNO 0361427 Title Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment Author(s) Lindgren, S. (US)
Affolder, A.A. (GB)
Allport, P.P. (GB)
Bates, R. (GB)
Betancourt, C. (US)
Böhm, Jan (FZU-D)
Brown, H. (GB)
Buttar, C. (GB)
Carter, J. R. (GB)
Casse, G. (GB)
Mikeštíková, Marcela (FZU-D) RID, ORCIDSource Title Nuclear Instruments & Methods in Physics Research Section A. Roč. 636, č. 1 (2011), "S111"-"S117". - : Elsevier Document Type Článek v odborném periodiku Grant LA08032 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10100502 - FZU-D (2005-2011) Language eng Country NL Keywords p-bulk silicon * surface damage * charge collection * punch-through voltage URL http://dx.doi.org/10.1016/j.nima.2010.04.094 Permanent Link http://hdl.handle.net/11104/0198739
Number of the records: 1