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Exchange bias of a ferromagnetic semiconductor by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry
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SYSNO 0354476 Title Exchange bias of a ferromagnetic semiconductor by a ferromagnetic metal: Fe/(Ga,Mn)As bilayer films studied by XMCD measurements and SQUID magnetometry Author(s) Olejník, Kamil (FZU-D) RID, ORCID
Wadley, P. (GB)
Haigh, J.A. (GB)
Edmonds, K. W. (GB)
Campion, R. P. (GB)
Rushforth, A.W. (GB)
Gallagher, B. L. (GB)
Foxon, C. T. (GB)
Jungwirth, Tomáš (FZU-D) RID, ORCID
Wunderlich, Joerg (FZU-D) RID, ORCID
Dhesi, S.S. (GB)
Cavill, S.A. (GB)
van der Laan, G. (GB)
Arenholz, E. (US)Source Title Physical Review. B. Roč. 81, č. 10 (2010), 104402/1-104402/5 Document Type Článek v odborném periodiku Grant 215368, XE - EU countries 214499, XE - EU countries KAN400100652 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) LC510 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) CEZ AV0Z10100521 - FZU-D (2005-2011) Language eng Country US Keywords ferromagnetic semiconductors * exchange bias Permanent Link http://hdl.handle.net/11104/0193470
Number of the records: 1