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Probing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements

    1.
    SYSNO0353131
    TitleProbing structure and microstructure of epitaxial Ni–Mn–Ga films by reciprocal space mapping and pole figure measurements
    Author(s) Ge, Y. (FI)
    Heczko, Oleg (FZU-D) RID, ORCID
    Hannula, S.-P. (FI)
    Fähler, S. (DE)
    Source Title Acta Materialia. Roč. 58, č. 20 (2010), 6665-6671. - : Elsevier
    Document TypeČlánek v odborném periodiku
    GrantM100100913, CZ - Czech Republic
    CEZAV0Z10100520 - FZU-D (2005-2011)
    Languageeng
    CountryGB
    Keywords reciprocal space mapping * thin film * Ni–Mn–Ga * martensite * magnetic shape memory
    Permanent Linkhttp://hdl.handle.net/11104/0192458
     
Number of the records: 1  

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