Number of the records: 1

Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes

SYSNO	0353046
Title	Detection of Secondary Electrons by Scintillation Detector in Variable Pressure Scanning Electron Microscopes
Author(s)	Jirák, J. (CZ) Čudek, P. (CZ) Neděla, Vilém (UPT-D)_{RID, ORCID, SAI}
Source Title	Proceedings of the 17th IFSM International Microscopy Congress. I10.14: 1-2. - Rio de Janeiro : Sociedade Brasileira de Microscopia e Microanilise, 2010
Conference	International Microscopy Congress (IMC17) /17./, Rio de Janeiro, 19.09.2010-24.09.2010
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	GAP102/10/1410 GA ČR - Czech Science Foundation (CSF)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
Language	eng
Country	BR
Keywords	VPSEM * scintillation detector
Permanent Link	http://hdl.handle.net/11104/0192396

Number of the records: 1