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Laser source for interferometry in nanotechnology
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SYSNO 0352207 Title Laser source for interferometry in nanotechnology Author(s) Hrabina, Jan (UPT-D) RID, ORCID, SAI
Lazar, Josef (UPT-D) RID, ORCID, SAI
Číp, Ondřej (UPT-D) RID, SAI, ORCID
Čížek, Martin (UPT-D) RID, ORCID, SAISource Title 17th Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proceedings of SPIE Vol. 7746). 77461I: 1-6. - Bellingham : SPIE, 2010 Conference Slovak-Czech-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics /17./, Liptovsky Jan, 06.09.2010 Document Type Konferenční příspěvek (zahraniční konf.) Grant LC06007 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic 2C06012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) 2A-1TP1/127 GA MPO - Ministry of Industry and Trade (MPO) FT-TA3/133 GA MPO - Ministry of Industry and Trade (MPO) 2A-3TP1/113 GA MPO - Ministry of Industry and Trade (MPO) GA102/09/1276 GA ČR - Czech Science Foundation (CSF) GA102/07/1179 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z20650511 - UPT-D (2005-2011) Language eng Country US Keywords atomic force microscopy * nanometrology * interferometry Permanent Link http://hdl.handle.net/11104/0191774
Number of the records: 1