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Semiconductor laser sources at 760 nm wavelength for nanometrology

SYSNO	0352185
Title	Semiconductor laser sources at 760 nm wavelength for nanometrology
Author(s)	Mikel, Břetislav (UPT-D)_{RID, SAI} Buchta, Zdeněk (UPT-D)_{RID, SAI, ORCID} Lazar, Josef (UPT-D)_{RID, ORCID, SAI} Číp, Ondřej (UPT-D)_{RID, SAI, ORCID}
Source Title	Proceedings of the 9th WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronic. S. 96-101. - Sofia : WSEAS EUROPMENT Press, 2010
Conference	WSEAS International Conference on Microelectronics, Nanoelectronics, Optoelectronic /9./, Catania, 29.05.2010-31.10.2010
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	2A-1TP1/127 GA MPO - Ministry of Industry and Trade (MPO)
	ED0017/01/01 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
	GP102/09/P293 GA ČR - Czech Science Foundation (CSF)
	GP102/09/P630 GA ČR - Czech Science Foundation (CSF)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
Language	eng
Country	BG
Keywords	laser interferometry * absolute measurement * tunable laser diodes
Permanent Link	http://hdl.handle.net/11104/0191758

Number of the records: 1