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X-ray diffraction analysis of multilayer porous InP(001) structure
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SYSNO 0351779 Title X-ray diffraction analysis of multilayer porous InP(001) structure Author(s) Lomov, A. A. (RU)
Punegov, V. I. (RU)
Vasil'ev, A. L. (RU)
Nohavica, Dušan (URE-Y)
Gladkov, Petar (URE-Y)
Kartsev, A. A. (DE)
Novikov, D. V. (DE)Source Title Crystallography Reports. Roč. 55, č. 2 (2010), s. 182-190. - : Pleiades Publishing Document Type Článek v odborném periodiku CEZ AV0Z20670512 - URE-Y (2005-2011) Language eng Country RU Keywords silicon layers * INP Permanent Link http://hdl.handle.net/11104/0191457
Number of the records: 1