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3D characterization of material structure using scanning electron microscopy (SEM) and focused ion beam (FIB)

SYSNO	0351718
Title	3D characterization of material structure using scanning electron microscopy (SEM) and focused ion beam (FIB)
Author(s)	Hradilová, Monika (FZU-D) Jäger, Aleš (FZU-D)_{RID, ORCID} Lejček, Pavel (FZU-D)_{RID, ORCID, SAI}
Source Title	Metal 2010 - 19th international conference on metallurgy and materials. S. 152-153. - Ostrava : Tanger s.r.o, 2010
Conference	Metal 2010, Rožnov pod Radhoštěm, 18.05.2010-20.05.2010
Document Type	Konferenční příspěvek (zahraniční konf.)
CEZ	AV0Z10100520 - FZU-D (2005-2011)
Language	eng
Country	CZ
Keywords	scanning electron microscopy * focused ion beam * 3D characterization
Permanent Link	http://hdl.handle.net/11104/0191410

Number of the records: 1