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Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy
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SYSNO 0343393 Title Non-destructive Depth Profiling of the Activated Ti-Zr-V Getter by Means of Excitation Energy Resolved Photoelectron Spectroscopy Author(s) Pavluch, J. (CZ)
Zommer, L. (PL)
Mašek, K. (CZ)
Skála, T. (IT)
Šutara, F. (CZ)
Nehasil, V. (CZ)
Píš, I. (CZ)
Polyak, Yaroslav (UFCH-W)Source Title Analytical Sciences. Roč. 26, č. 2 (2010), s. 209-215 Document Type Článek v odborném periodiku CEZ AV0Z40400503 - UFCH-W (2005-2011) Language eng Country JP Keywords non-evaporable getter materials * XPS methods Permanent Link http://hdl.handle.net/11104/0185884
Number of the records: 1