Number of the records: 1  

Grain Contrast Imaging in UHV SLEEM

  1. 1.
    SYSNO0340746
    TitleGrain Contrast Imaging in UHV SLEEM
    Author(s) Mikmeková, Šárka (UPT-D) RID, SAI, ORCID
    Hovorka, Miloš (UPT-D)
    Müllerová, Ilona (UPT-D) RID, SAI, ORCID
    Man, O. (CZ)
    Pantělejev, L. (CZ)
    Frank, Luděk (UPT-D) RID, SAI, ORCID
    Source Title Materials Transactions. Roč. 51, č. 2 (2010), s. 292-296. - : Japan Institute of Metals and Materials
    Document TypeČlánek v odborném periodiku
    Grant OE08012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS)
    CEZAV0Z20650511 - UPT-D (2005-2011)
    Languageeng
    CountryJP
    Keywords scanning low energy electron microscopy * electron backscatter diffraction (EBSD) * grain contrast * ultra-fine grained materials
    URLhttp://www.jim.or.jp/journal/e/51/02/292.html
    Permanent Linkhttp://hdl.handle.net/11104/0183927
     
Number of the records: 1  

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