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New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors
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SYSNO 0339531 Title New insights on atomic-resolution frequency-modulation Kelvin-probe force-microscopy imaging of semiconductors Author(s) Sadewasser, S. (DE)
Jelínek, Pavel (FZU-D) RID, ORCID
Fang, Ch.-K. (JP)
Custance, Ó. (JP)
Yamada, Y. (JP)
Sugimoto, Y. (JP)
Abe, M. (JP)
Morita, S. (JP)Source Title Physical Review Letters. Roč. 103, č. 26 (2009), 266103/1-266103/4. - : American Physical Society Document Type Článek v odborném periodiku Grant GA202/09/0545 GA ČR - Czech Science Foundation (CSF) IAA100100905 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100521 - FZU-D (2005-2011) Language eng Country US Keywords KPFM * atomic force microscopy * DFT * atomic resolution * semiconductor surface Permanent Link http://hdl.handle.net/11104/0183034
Number of the records: 1