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Laser sources at 760 nm wavelength for metrology of length
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SYSNO 0336817 Title Laser sources at 760 nm wavelength for metrology of length Author(s) Mikel, Břetislav (UPT-D) RID, SAI
Buchta, Zdeněk (UPT-D) RID, SAI, ORCID
Lazar, Josef (UPT-D) RID, ORCID, SAI
Číp, Ondřej (UPT-D) RID, SAI, ORCIDSource Title Africon 2009. 5308091: 1-6. - Los Alamitos : IEEE, 2009 Conference Africon 2009, Nairobi, 23.09.2009-25.09.2009 Document Type Konferenční příspěvek (zahraniční konf.) Grant LC06007 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic 2C06012 GA MŠMT - Ministry of Education, Youth and Sports (MEYS) KAN311610701 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) 2A-1TP1/127 GA MPO - Ministry of Industry and Trade (MPO) FT-TA3/133 GA MPO - Ministry of Industry and Trade (MPO) 2A-3TP1/113 GA MPO - Ministry of Industry and Trade (MPO) GA102/07/1179 GA ČR - Czech Science Foundation (CSF) GP102/09/P293 GA ČR - Czech Science Foundation (CSF) GP102/09/P630 GA ČR - Czech Science Foundation (CSF) GA102/09/1276 GA ČR - Czech Science Foundation (CSF) CEZ AV0Z20650511 - UPT-D (2005-2011) Language eng Country US Keywords laser interferometry * absolute measurement * tunable laser diodes Permanent Link http://hdl.handle.net/11104/0180969
Number of the records: 1