Scanning low energy electron microscopy of doped silicon at units of eV

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SYSNO	0335882
Title	Scanning low energy electron microscopy of doped silicon at units of eV
Author(s)	Hovorka, Miloš (UPT-D) Mikmeková, Šárka (UPT-D)_{RID, SAI, ORCID} Frank, Luděk (UPT-D)_{RID, SAI, ORCID}
Source Title	6th International Workshop on LEEM/PEEM. S. 110. - Trieste : ELETTRA, 2008
Conference	International Workshop on LEEM/PEEM /6./, Trieste, 07.09.2008-11.09.2008
Document Type	Abstrakt
Grant	IAA100650803 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
Language	eng
Country	IT
Keywords	very low energy electron microscopy * scanning low energy electron microscope
Permanent Link	http://hdl.handle.net/11104/0180232

Number of the records: 1