Number of the records: 1
Cathodoluminescence study of electron beam formed defects in polysilanes
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SYSNO 0335270 Title Cathodoluminescence study of electron beam formed defects in polysilanes Author(s) Schauer, P. (CZ)
Schauer, Petr (UPT-D) RID, SAI, ORCID
Kuřitka, I. (CZ)
Nešpůrek, Stanislav (UMCH-V) [OPTOEL] RIDSource Title MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Vol. 3: 383-384. - Graz : Verlag der Technischen Universität, 2009 Conference MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./, Graz, 30.08.2009-04.09.2009 Document Type Konferenční příspěvek (zahraniční konf.) Grant IAA100100622 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z20650511 - UPT-D (2005-2011) AV0Z40500505 - UMCH-V (2005-2011) Language eng Country AT Keywords cathodoluminescence * electron beam degradation * poly[methyl(phenyl)silane] * PMPSi * silicon polymers URL http://www.univie.ac.at/asem/Graz_MC_09/papers/55161.pdf Permanent Link http://hdl.handle.net/11104/0179779
Number of the records: 1