Number of the records: 1

Electron beam induced current measurement on a specimen biased in a cathode lens

SYSNO	0335265
Title	Electron beam induced current measurement on a specimen biased in a cathode lens
Author(s)	Horáček, Miroslav (UPT-D)_{RID, ORCID, SAI} Zobač, Martin (UPT-D)_{RID, ORCID} Vlček, Ivan (UPT-D)_{RID, ORCID, SAI}
Source Title	MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Vol. 1: 211-212. - Graz : Verlag der Technischen Universität, 2009
Conference	MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./, Graz, 30.08.2009-04.09.2009
Document Type	Konferenční příspěvek (zahraniční konf.)
Grant	IAA100650803 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR)
CEZ	AV0Z20650511 - UPT-D (2005-2011)
Language	eng
Country	AT
Keywords	elektron beam induced current * SEM * very low energy electrons * cathode lens * specimen bias
URL	http://www.univie.ac.at/asem/Graz_MC_09/papers/77645.pdf
Permanent Link	http://hdl.handle.net/11104/0179775

Number of the records: 1