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Secondary electron contrast in doped semiconductor with presence of a surface ad-layer
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SYSNO 0335263 Title Secondary electron contrast in doped semiconductor with presence of a surface ad-layer Author(s) Mika, Filip (UPT-D) RID, SAI, ORCID
Hovorka, Miloš (UPT-D)
Frank, Luděk (UPT-D) RID, SAI, ORCIDSource Title MC 2009 - Microscopy Conference: First Joint Meeting of Dreiländertagung and Multinational Conference on Microscopy. Vol. 1: 199-200. - Graz : Verlag der Technischen Universität, 2009 Conference MC 2009 - Joint Meeting of Dreiländertagung and Multinational Congress on Microscopy /9./, Graz, 30.08.2009-04.09.2009 Document Type Konferenční příspěvek (zahraniční konf.) Grant GP102/09/P543 GA ČR - Czech Science Foundation (CSF) IAA100650803 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z20650511 - UPT-D (2005-2011) Language eng Country AT Keywords dopant contrast * secondary electrons * semiconductor URL http://www.univie.ac.at/asem/Graz_MC_09/papers/51426.pdf Permanent Link http://hdl.handle.net/11104/0179773
Number of the records: 1