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Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM
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SYSNO 0322208 Title Preparation of location-specific thin foils from Fe-3%Si bi- and tri- crystals for examination in a FEG-STEM Title Příprava lokalizovaných tenkých folií z bi- a trikrystalů Fe-3%Si pro FEG-STEM vyšetřování Author(s) Sorbello, F. (GB)
Hughes, G.M. (GB)
Lejček, Pavel (FZU-D) RID, ORCID, SAI
Heard, P.J. (GB)
Flewitt, P.E.J. (GB)Source Title Ultramicroscopy. Roč. 109, č. 2 (2009), 147-153. - : Elsevier Document Type Článek v odborném periodiku Grant IAA1010414 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR) CEZ AV0Z10100520 - FZU-D (2005-2011) Language eng Country NL Keywords FEG-STEM * Fe-3%Si * Thin foils * focused ion beam Permanent Link http://hdl.handle.net/11104/0170530
Number of the records: 1