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RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI
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SYSNO 0315789 Title RBS, UV-VIS and XPS characterization of 40 keV Ni+ implanted PEEK, PET and PI Title RBS, UV-VIS a XPS charakterizace Ni+ 40 keV implantovaných polymerů PEEK, PET a PI Author(s) Macková, Anna (UJF-V) RID, ORCID, SAI
Bočan, Jiří (UJF-V)
Khaibullin, R. I. (RU)
Švorčík, V. (CZ)
Slepička, P. (CZ)
Siegel, J. (CZ)
Valeev, V. F. (RU)Source Title 16th International Conference on Ion Beam Modification of Materials Book of Abstracts. S. 317-317. - Dresden : Institute of Ion Beam Physics and Materials Research, Forschungzentrum Dresden-Rossendorf, 2008 Conference 16th International Conference on Ion Beam Modification of Materials, Dresden, 31.08.2008-05.09.2008 Document Type A2 Grant KJB100480601 GA AV ČR - Academy of Sciences of the Czech Republic (AV ČR), CZ - Czech Republic LC06041 GA MŠMT - Ministry of Education, Youth and Sports (MEYS), CZ - Czech Republic CEZ AV0Z10480505 - UJF-V (2005-2011) Language eng Country DE Keywords ion implantation in polymers * TRIDYN * Ion Beam Analysis * UV-VIS, XPS Permanent Link http://hdl.handle.net/11104/0165889
Number of the records: 1