Number of the records: 1  

SHIM and TPEM: Getting More Information from Non Linear Excitation

  1. 1.
    SYSNO0313399
    TitleSHIM and TPEM: Getting More Information from Non Linear Excitation
    TitleSHIM a TPFM: více informace z nelineární excitace
    Author(s) Bianchini, P. (IT)
    Vicidomini, G. (IT)
    Mondal, P. P. (IT)
    Ramoino, P. (IT)
    Usai, C. (IT)
    Janáček, Jiří (FGU-C) RID, ORCID
    Kubínová, Lucie (FGU-C) RID, ORCID
    Diaspro, A. (IT)
    Source Title Focus on Microscopy. S. 136-136. - Valencia : University of Valencia, 2007
    Conference Focus on Microscopy FOM 2007, Valencia, 10.04.2007-13.04.2007
    Document TypeAbstrakt
    CEZAV0Z50110509 - FGU-C (2005-2011)
    Languageeng
    CountryES
    Keywords spr2 * SHIM * SHG * TPEF
    Permanent Linkhttp://hdl.handle.net/11104/0164229
     
Number of the records: 1  

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